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Generation of surface plasmon resonance and lossy mode resonance by thermal treatment of ITO thin-films
| dc.creator | Del Villar, Ignacio | es_ES |
| dc.creator | Ruiz Zamarreño, Carlos | es_ES |
| dc.creator | Hernáez Sáenz de Zaitigui, Miguel | es_ES |
| dc.creator | Sánchez Zábal, Pedro | es_ES |
| dc.creator | Arregui San Martín, Francisco Javier | es_ES |
| dc.creator | Matías Maestro, Ignacio | es_ES |
| dc.date.accessioned | 2018-03-28T07:51:21Z | |
| dc.date.available | 2018-03-28T07:51:21Z | |
| dc.date.issued | 2014 | |
| dc.identifier.issn | 0030-3992 (Print) | |
| dc.identifier.issn | 1879-2545 (Electronic) | |
| dc.identifier.uri | https://hdl.handle.net/2454/28108 | |
| dc.description.abstract | Silicon wafers coated with IndiumTinOxide (ITO) by application of sputtering technique have been characterized after different post-annealing techniques, showing that this last factor is critical for the quality of the thin-film and for the creation and tuning of both surface plasmon resonances and lossy mode resonances. By adequate selection of the ITO thin-film thickness both resonances can be tracked in the same spectrum, which can be used in sensor and optical communications fields. | en |
| dc.description.sponsorship | This work was supported in part by the Spanish Ministry of Education and Science-FEDER TEC2013-43679-R. | en |
| dc.format.mimetype | application/pdf | en |
| dc.language.iso | eng | en |
| dc.publisher | Elsevier | en |
| dc.relation.ispartof | Optics & Laser Technology, vol. 69, june 2015, pgs. 1-7 | en |
| dc.rights | © 2014 Elsevier B.V. The manuscript version is made available under the CC BY-NC-ND 4.0 license. | en |
| dc.rights.uri | https://creativecommons.org/licenses/by-nc-nd/4.0/ | |
| dc.subject | Thin films | en |
| dc.subject | Optical resonance | en |
| dc.subject | Sensors | en |
| dc.title | Generation of surface plasmon resonance and lossy mode resonance by thermal treatment of ITO thin-films | en |
| dc.type | Artículo / Artikulua | es |
| dc.type | info:eu-repo/semantics/article | en |
| dc.contributor.department | Ingeniería Eléctrica y Electrónica | es_ES |
| dc.contributor.department | Ingeniaritza Elektrikoa eta Elektronikoa | eu |
| dc.rights.accessRights | Acceso abierto / Sarbide irekia | es |
| dc.rights.accessRights | info:eu-repo/semantics/openAccess | en |
| dc.identifier.doi | 10.1016/j.optlastec.2014.12.012 | |
| dc.relation.projectID | info:eu-repo/grantAgreement/MINECO//TEC2013-43679-R/ES/ | en |
| dc.relation.publisherversion | https://doi.org/10.1016/j.optlastec.2014.12.012 | |
| dc.type.version | Versión aceptada / Onetsi den bertsioa | es |
| dc.type.version | info:eu-repo/semantics/acceptedVersion | en |
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La licencia del ítem se describe como © 2014 Elsevier B.V. The manuscript version is made available under the CC BY-NC-ND 4.0 license.
