Artículos de revista DIEC - IEKS Aldizkari artikuluak

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Browsing Artículos de revista DIEC - IEKS Aldizkari artikuluak by Author "Albert, Jacques"

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    PublicationOpen Access
    All-fiber ellipsometer for nanoscale dielectric coatings
    (Chinese Academy of Sciences, 2023) Imas González, José Javier; Matías Maestro, Ignacio; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Ruiz Zamarreño, Carlos; Albert, Jacques; Ingeniería Eléctrica, Electrónica y de Comunicación; Institute of Smart Cities - ISC; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren
    Multiple mode resonance shifts in tilted fiber Bragg gratings (TFBGs) are used to simultaneously measure the thickness and the refractive index of TiO2 thin films formed by Atomic Layer Deposition (ALD) on optical fibers. This is achieved by comparing the experimental wavelength shifts of 8 TFBG resonances during the deposition process with simulated shifts from a range of thicknesses (T) and values of the real part of the refractive index (n). The minimization of an error function computed for each (n, T) pair then provides a solution for the thickness and refractive index of the deposited film and, a posteriori, to verify the deposition rate throughout the process from the time evolution of the wavelength shift data. Validations of the results were carried out with a conventional ellipsometer on flat witness samples deposited simultaneously with the fiber and with scanning electron measurements on cut pieces of the fiber itself. The final values obtained by the TFBG (n = 2.25, final thickness of 185 nm) were both within 4% of the validation measurements. This approach provides a method to measure the formation of nanoscale dielectric coatings on fibers in situ for applications that require precise thicknesses and refractive indices, such as the optical fiber sensor field. Furthermore, the TFBG can also be used as a process monitor for deposition on other substrates for deposition methods that produce uniform coatings on dissimilar shaped substrates, such as ALD.
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    PublicationOpen Access
    Mode transitions and thickness measurements during deposition of nanoscale TiO2 coatings on tilted fiber Bragg gratings
    (IEEE, 2022) Imas González, José Javier; Albert, Jacques; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Ruiz Zamarreño, Carlos; Matías Maestro, Ignacio; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de Comunicación
    The mode transition is a phenomenon observed in thin film coated long period fiber gratings (LPGs) and singlemode multimode single-mode (SMS) fibers for certain values of the coating thickness and refractive index, resulting in increased sensitivity for sensing applications. It is shown here that mode transitions occur simultaneously for a large number of mode resonances in the transmission spectra of tilted fiber Bragg gratings (TFBG) measured during the deposition of ~350nm thick TiO2 coatings by Atomic Layer Deposition (ALD). In TFBGs, the mode transition shows up as an acceleration of the resonance wavelength shift vs thickness, but without fading of the resonance amplitude. Furthermore, the results show that the mode transition for cladding modes with predominantly “TE” polarization at the cladding boundary is significantly sharper than that of predominantly “TM” polarized modes and that it occurs at a smaller coating thickness (<100 nm vs >200 nm). Finally, using a separately determined coating refractive index (2.14, by ellipsometry on witness flats deposited simultaneously) and simulations of the resonance shifts of the TFBG with coating thickness, it is demonstrated that a TFBG connected to a spectral interrogation system can be used to measure the growth of a coating on the surface of the fiber in real time.