Álvarez Botero, Germán Andrés

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https://academica-e.unavarra.es/handle/2454/50616

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Álvarez Botero

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Germán Andrés

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Ingeniería Eléctrica, Electrónica y de Comunicación

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ISC. Institute of Smart Cities

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0000-0002-1143-6104

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751433

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811966

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20131
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Author: Murphy-Arteaga, Roberto S. × Subject: CMOSdevices ×

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    PublicationOpen Access
    Modeling and parameter extraction of test fixtures for MOSFET on-wafer measurements up to 60 GHz
    (Wiley, 2013) Álvarez Botero, Germán Andrés; Torres-Torres, Reydezel; Murphy-Arteaga, Roberto S.; Ingeniería Eléctrica y Electrónica; Ingeniaritza Elektrikoa eta Elektronikoa
    We present a circuit model and parameter determination methodology for test fixtures used for on-wafer S-parameter measurements on CMOS devices. The model incorporates the frequency dependence of the series resistances and inductances due to the skin effect occurring in the metal pads. Physically based representations for this effect allow for excellent theory-experiment correlations for different dummy structures, as well as when de-embedding transistor measurements up to 60 GHz.