Imas González, José Javier
Loading...
Email Address
person.page.identifierURI
Birth Date
Job Title
Last Name
Imas González
First Name
José Javier
person.page.departamento
Ingeniería Eléctrica, Electrónica y de Comunicación
person.page.instituteName
ORCID
person.page.observainves
person.page.upna
Name
- Publications
- item.page.relationships.isAdvisorOfPublication
- item.page.relationships.isAdvisorTFEOfPublication
- item.page.relationships.isAuthorMDOfPublication
12 results
Search Results
Now showing 1 - 10 of 12
Publication Open Access Twin lossy mode resonance on a single D-shaped optical fiber(Optica, 2021) Imas González, José Javier; Ruiz Zamarreño, Carlos; Del Villar, Ignacio; Pérez Escudero, José Manuel; Matías Maestro, Ignacio; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de ComunicaciónThis letter presents the fabrication of dual lossy mode resonance (LMR) refractometers based on titanium dioxide (TiO2) and tin oxide (SnO2) thin films deposited on a single side-polished D-shaped optical fiber. For the first time, to the best of our knowledge, two independent LMRs are obtained in the same D-shaped optical fiber, by using a step-shaped nanostructure consisting of a first section of TiO2 with a thickness of 120 nm and a second section with a thickness of 140 nm (120 nm of TiO2 and 20 nm of SnO2). Each section is responsible for generating a first-order LMR with TM-polarized light (LMRTM). TiO2 is deposited by atomic layer deposition and SnO2 by electron-beam deposition. The theoretical results show that the depth of each of the resonances of the dual LMR depends on the length of the corresponding section. Two experimental devices were fabricated with sections of different lengths, and their sensitivities were studied, achieving values ∼ 4000 nm/refractive index unit (RIU) with a maximum of 4506 nm/RIU for values of the SRI between 1.3327 and 1.3485.Publication Open Access Optimization of fiber Bragg gratings inscribed in thin films deposited on D-shaped optical fibers(MDPI, 2021) Imas González, José Javier; Ruiz Zamarreño, Carlos; Del Villar, Ignacio; Matías Maestro, Ignacio; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de ComunicaciónA fiber Bragg grating patterned on a SnO2 thin film deposited on the flat surface of a D-shaped polished optical fiber is studied in this work. The fabrication parameters of this structure were optimized to achieve a trade-off among reflected power, full width half maximum (FWHM), sensitivity to the surrounding refractive index (SRI), and figure of merit (FOM). In the first place, the influence of the thin film thickness, the cladding thickness between the core and the flat surface of the D-shaped fiber (neck), and the length of the D-shaped zone over the reflected power and the FWHM were assessed. Reflected peak powers in the range from −2 dB to −10 dB can be easily achieved with FWHM below 100 pm. In the second place, the sensitivity to the SRI, the FWHM, and the FOM were analyzed for variations of the SRI in the 1.33–1.4 range, the neck, and the thin-film thickness. The best sensitivities theoretically achieved for this device are next to 40 nm/RIU, while the best FOM has a value of 114 RIU−1.Publication Open Access A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures(Elsevier, 2025-02-01) Imas González, José Javier; Matías Maestro, Ignacio; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Vitoria Pascual, Ignacio; Ruiz Zamarreño, Carlos; Ingeniería Eléctrica, Electrónica y de Comunicación; Ingeniaritza Elektrikoa, Elektronikoa eta Telekomunikazio Ingeniaritza; Institute of Smart Cities - ISCFrom an optical perspective, depending on the relationship between the real (n) and imaginary (k) parts of its refractive index, three broad categories of materials can be distinguished: metals (k ¿ n), dielectrics (n ¿ k), and materials in which n ¿ k (termed here excitonic materials). The modes and optical resonances that appear in a thin film bounded by two dielectrics with similar refractive index, what we call here a double interface structure, have been widely studied in the case of metals, but not for dielectrics, or materials with n ¿ k. In this work, we propose a new approach, based on employing the phase matching condition to correlate the resonances that appear in the wavelength versus incident angle color maps of the reflected power with the modal analysis of the cross section of the structure. This analysis is performed, using an attenuated total reflection (ATR) setup, for thin film materials that belong to each of the mentioned categories: a metal (gold, Au), a dielectric (titanium dioxide, TiO2), and a material with n ¿ k (chromium, Cr). The theoretical analysis is supported with experimental results. It is demonstrated that this method enables to identify any resonance at any wavelength or incident angle, being valid for all three types of materials. Therefore, it is considered the suggested approach will help the research in these materials and in the double interface structure in the optics and photonics field.Publication Open Access Mode transitions and thickness measurements during deposition of nanoscale TiO2 coatings on tilted fiber Bragg gratings(IEEE, 2022) Imas González, José Javier; Albert, Jacques; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Ruiz Zamarreño, Carlos; Matías Maestro, Ignacio; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de ComunicaciónThe mode transition is a phenomenon observed in thin film coated long period fiber gratings (LPGs) and singlemode multimode single-mode (SMS) fibers for certain values of the coating thickness and refractive index, resulting in increased sensitivity for sensing applications. It is shown here that mode transitions occur simultaneously for a large number of mode resonances in the transmission spectra of tilted fiber Bragg gratings (TFBG) measured during the deposition of ~350nm thick TiO2 coatings by Atomic Layer Deposition (ALD). In TFBGs, the mode transition shows up as an acceleration of the resonance wavelength shift vs thickness, but without fading of the resonance amplitude. Furthermore, the results show that the mode transition for cladding modes with predominantly “TE” polarization at the cladding boundary is significantly sharper than that of predominantly “TM” polarized modes and that it occurs at a smaller coating thickness (<100 nm vs >200 nm). Finally, using a separately determined coating refractive index (2.14, by ellipsometry on witness flats deposited simultaneously) and simulations of the resonance shifts of the TFBG with coating thickness, it is demonstrated that a TFBG connected to a spectral interrogation system can be used to measure the growth of a coating on the surface of the fiber in real time.Publication Open Access Mode transition during deposition of nanoscale ITO coatings on tilted fiber Bragg gratings(Optica Publishing Group, 2022) Imas González, José Javier; Albert, Jacques; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Ruiz Zamarreño, Carlos; Matías Maestro, Ignacio; Ingeniería Eléctrica, Electrónica y de Comunicación; Institute of Smart Cities - ISC; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio IngeniaritzarenThe mode transition phenomenon is experimentally demonstrated in tilted fiber Bragg gratings (TFBG) through the deposition of an indium tin oxide (ITO) thin film employing a DC sputtering machine.Publication Open Access Surface exciton polariton resonances (SEPR)-based sensors(Elsevier, 2023) Vitoria Pascual, Ignacio; Ruiz Zamarreño, Carlos; Ozcariz Celaya, Aritz; Imas González, José Javier; Del Villar, Ignacio; Matías Maestro, Ignacio; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de ComunicaciónA new type of resonance in the development of sensors using long-range surface exciton polariton (LRSEP) phenomena has been coined: surface exciton plasmon resonance (SEPR). The resonance was obtained in the reflected spectrum of a Kretschmann-Raether setup with a two-coupled-interface structure composed of 412 nm magnesium fluoride and 50 nm chromium thin films. The roles of different parameters such as thicknesses of the films and the incidence angles have been simulated. Some preliminary experimental results show a promising performance with a shift of the resonance central wavelength with changes in the incidence angle of -136.52 nm/° and a sensitivity of 23,221 nm/refractive index unit.Publication Open Access Tunable sensitivity in long period fiber gratings during mode transition with low refractive index intermediate layer(IEEE, 2022) Del Villar, Ignacio; Montoya-Cardona, Jorge; Imas González, José Javier; Reyes-Vera, Erick; Ruiz Zamarreño, Carlos; Matías Maestro, Ignacio; Cruz, José Luis; Ingeniería Eléctrica, Electrónica y de Comunicación; Institute of Smart Cities - ISC; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio IngeniaritzarenDouble-clad fibers where the second cladding has a lower refractive index than the first cladding, prove to be ideal structures for potentiating and tuning the sensitivity in long-period fiber gratings (LPFGs) operating in mode transition. When a thin film is deposited on the optical fiber, the second cladding performs acts as a barrier that initially prevents the transition to guidance in the thin film of one of the modes guided in the first cladding. Finally, the transition to guidance occurs with a sensitivity increase, in analogy to the tunnel effect observed in semiconductors. This improvement has been demonstrated both as a function of the thin film thickness and the surrounding medium refractive index, with enhancement factors of 4 and 2, respectively. This idea reinforces the performance of LPFGs, adding a new degree of freedom to the mode transition and the dispersion turning point phenomena. Moreover, the control of the variation of the effective index of cladding modes could be applied in other structures, such as tilted-fiber gratings or evanescent wave sensors.Publication Open Access Improving the width of lossy mode resonances (LMRs) in double-clad fibers(IEEE, 2023) Imas González, José Javier; Del Villar, Ignacio; Zubiate Orzanco, Pablo; Ruiz Zamarreño, Carlos; Matías Maestro, Ignacio; Ingeniería Eléctrica, Electrónica y de Comunicación; Institute of Smart Cities - ISC; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio IngeniaritzarenIn this work, the characteristics of lossy mode resonances (LMRs) in double-clad fibers where the refractive index (RI) of the second cladding is lower than that of the first cladding are analyzed both numerically and experimentally. In the first place, the LMRs spectra obtained with a 75 nm TiO 2 thin film are simulated, and it is observed that a thicker second cladding improves the width of the resonances, making them narrower. Then, two experimental cases (no second cladding, and second cladding with thickness of 1.13 μm) are assessed, showing a good agreement with the previous simulations. Finally, an experimental refractometric study is carried out in liquids (surrounding medium refractive index in the 1.34 - 1.40 range) for both fibers, calculating the full width at 1 dB (FW 1dB ), the sensitivity, and the figure of merit (FOM). The FW 1dB is better for the LMR obtained on the fiber with second cladding while the sensitivity is slightly greater for the fiber without second cladding. In the case of the FOM, it is higher for the double-clad fiber as the narrowing of the resonances outweighs the lower sensitivity. These results show that the performance of LMR-based optical fiber sensors can be improved by employing double-clad fibers.Publication Open Access Optical fiber thermo-refractometer(Optica, 2022) Imas González, José Javier; Ruiz Zamarreño, Carlos; Del Villar, Ignacio; Cardozo da Silva, Jean Carlos; Oliveira, V.; Matías Maestro, Ignacio; Ingeniería Eléctrica, Electrónica y de Comunicación; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio IngeniaritzarenThis work presents the implementation of a thermo-refractometer, which integrates the measurement of both refractive index and temperature in a single optical fiber structure. To this purpose, a lossy mode resonance (LMR)-based refractometer is obtained by means of the deposition of a titanium dioxide (TiO2) thin film onto a side-polished (D-shaped) single mode fiber. Measurement and subsequent temperature compensation are achieved by means of a fiber Bragg grating (FBG) inscribed in the core of the D-shaped region. The LMR wavelength shift is monitored in transmission while the FBG (FBG peak at 1533 nm) displacement is observed in reflection. The LMR is sensitive to both the surrounding refractive index (SRI), with a sensitivity of 3725.2 nm/RIU in the 1.3324-1.3479 range, and the temperature (- 0.186 nm/°C); while the FBG is only affected by the temperature (32.6 pm/°C in the 25°C - 45°C range). With these values, it is possible to recover the SRI and temperature variations from the wavelength shifts of the LMR and the FBG, constituting a thermo-refractometer, where it is suppressed the effect of the temperature over the refractometer operation, which could cause errors in the fourth or even third decimal of the measured SRI value.Publication Open Access All-fiber ellipsometer for nanoscale dielectric coatings(Chinese Academy of Sciences, 2023) Imas González, José Javier; Matías Maestro, Ignacio; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Ruiz Zamarreño, Carlos; Albert, Jacques; Ingeniería Eléctrica, Electrónica y de Comunicación; Institute of Smart Cities - ISC; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio IngeniaritzarenMultiple mode resonance shifts in tilted fiber Bragg gratings (TFBGs) are used to simultaneously measure the thickness and the refractive index of TiO2 thin films formed by Atomic Layer Deposition (ALD) on optical fibers. This is achieved by comparing the experimental wavelength shifts of 8 TFBG resonances during the deposition process with simulated shifts from a range of thicknesses (T) and values of the real part of the refractive index (n). The minimization of an error function computed for each (n, T) pair then provides a solution for the thickness and refractive index of the deposited film and, a posteriori, to verify the deposition rate throughout the process from the time evolution of the wavelength shift data. Validations of the results were carried out with a conventional ellipsometer on flat witness samples deposited simultaneously with the fiber and with scanning electron measurements on cut pieces of the fiber itself. The final values obtained by the TFBG (n = 2.25, final thickness of 185 nm) were both within 4% of the validation measurements. This approach provides a method to measure the formation of nanoscale dielectric coatings on fibers in situ for applications that require precise thicknesses and refractive indices, such as the optical fiber sensor field. Furthermore, the TFBG can also be used as a process monitor for deposition on other substrates for deposition methods that produce uniform coatings on dissimilar shaped substrates, such as ALD.