Ndagijimana, Adolphe

Loading...
Profile Picture

Email Address

Birth Date

Job Title

Last Name

Ndagijimana

First Name

Adolphe

person.page.departamento

Ingeniería Eléctrica, Electrónica y de Comunicación

person.page.instituteName

person.page.observainves

person.page.upna

Name

Search Results

Now showing 1 - 1 of 1
  • PublicationOpen Access
    Impact of diffraction on terahertz compressed sensing single-pixel imaging
    (IEEE, 2024) Ndagijimana, Adolphe; Ederra Urzainqui, Íñigo; Heredia Conde, Miguel; Ingeniería Eléctrica, Electrónica y de Comunicación; Ingeniaritza Elektrikoa, Elektronikoa eta Telekomunikazio Ingeniaritza
    Terahertz (THz) single-pixel imaging, through compressive sensing, enables sampling below Nyquist rates and bypasses the need for mechanical scanning and the limitation of availability of high-resolution cost-effective THz imaging array detectors off-the-shelf. This research investigates how diffraction phenomena affect THz single-pixel imaging and properties of sensing matrices, along with the sparse signal reconstruction process. We introduce a variety of strategies designed to mitigate the effects of diffraction, along with novel methods to counteract the disruptions caused by THz physics, thereby preserving the integrity of the original sensing matrix and improving signal recoverability. A comprehensive simulation study sheds light on the effects of diffraction on the sensing matrices and their impact on signal reconstruction. Our results highlight the importance of accurate diffraction minimization techniques and sophisticated modelling in enhancing THz imaging systems.