Person: Pascual Miqueleiz, Julio María
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Pascual Miqueleiz
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Julio María
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Ingeniería Eléctrica y Electrónica
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0000-0002-9495-5910
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810225
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Publication Open Access Long-term degradation rate of crystalline silicon PV modules at commercial PV plants: an 82-MWp assessment over 10 years(Wiley, 2021) Pascual Miqueleiz, Julio María; Martínez Moreno, Francisco; García Solano, Miguel; Marcos Álvarez, Javier; Marroyo Palomo, Luis; Lorenzo Pigueiras, Eduardo; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de ComunicaciónDue to high competitiveness in the PV sector, despite the low degradation rate of crystalline silicon PV modules (below 0.5%/year), it is still important for utilities to know its actual value due to its impact on energy yield and hence, profitability, over the lifetime of a PV plant. However, uncertainties related to both the influence of downtime periods due to problems that may appear under normal operation of a commercial PV plant and to the measurement of degradation rates at PV plant level make this a challenging task. In order to obtain a significant value, in this paper, three measuring methods with different uncertainty sources are used for 82 MWp of PV modules on different locations in Spain and Portugal over 10 years. According to the different methods used and PV plants analyzed, excluding PV plants with problems, a range of degradation rates between 0.01 and 0.47%/year has been found. The overall average value observed is 0.27%/year. The findings of this work have also revealed the great importance of good operation and maintenance practices in order to keep overall low degradation rates.Publication Open Access On the on-site measurement of the degradation rate of crystalline silicon PV modules at plant level(IEEE, 2018) Pascual Miqueleiz, Julio María; Berrueta Irigoyen, Alberto; Marcos Álvarez, Javier; García Solano, Miguel; Marroyo Palomo, Luis; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de ComunicaciónThis paper proposes a method for measuring the degradation rate of crystalline silicon PV modules at plant level in two different ways as a form of verification. As actual levels of degradation rate have been observed to be as low as 0.2%/a, the uncertainties make it difficult to measure this value accurately at plant level. However, despite the low value, it is still important to know the actual degradation rate due to its impact on energy yield. In this paper, two ways of measuring the degradation rate at plant level are proposed. These two methods, with different uncertainty sources, are proposed to be used jointly in order to have a better approach to the real value. Finally, an example of measurement in a 1.78 MW PV plant is presented.