Martínez de Aguirre Escobar, AlejandroÁlvarez-Mozos, JesúsGiménez Díaz, RafaelMilenković, MilutinPfeifer, Norbert2021-04-202021-04-202018A. Martinez-Agirre et al., 'On the Influence of Spatial Resolution in Soil Surface Roughness Characterization Using Tls and Sfm Techniques,' IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium, Valencia, Spain, 2018, pp. 3362-3365, doi: 10.1109/IGARSS.2018.8518553.978-1-5386-7151-12153-7003 (Electronic)10.1109/IGARSS.2018.8518553https://academica-e.unavarra.es/handle/2454/39563Soil surface roughness strongly affects the scattering of microwaves and determines the backscattering coefficient observed by SAR (Synthetic Aperture Radar) sensors. The aim of this study is to analyze the influence of the spatial resolution of Terrestrial Laser Scanner (TLS) and Structure from Motion (SfM) techniques to parameterize surface roughness over agricultural soils. Three experimental plots (5 x 5 meters) representing different roughness conditions were measured by TLS and SfM techniques. Roughness parameters (s and l) were calculated from profiles obtained at different spatial resolutions in parallel and in perpendicular to the tillage direction on each plot. The results showed minor differences in the parameters values between both techniques and, in general, a decreasing trend and an increasing trend for lower spatial resolutions for parameter s and l, respectively.4 p.application/pdfeng© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other work.Surface roughnessMeasurement techniquesTLSSfMSpatial resolutioninfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/openAccess