Listar Artículos de revista DIEE - IEES Aldizkari artikuluak por tema "Thin films (optical properties)"
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Development of an optical refractometer by analysis of one-dimensional photonic bandgap structures with defects
A theoretical analysis of an optical fiber photonic-bandgap-based refractometer is presented. The design is based on a quarter-wave ref lector with one defect. By modifying both the real and the imaginary parts of the index ...