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dc.creatorBarber, Matías Ernestoes_ES
dc.creatorGrings, Francisco Matíases_ES
dc.creatorÁlvarez-Mozos, Jesúses_ES
dc.creatorPiscitelli, Marcelaes_ES
dc.creatorPerna, Pablo Alejandroes_ES
dc.creatorKarszenbaum, Haydeees_ES
dc.date.accessioned2017-11-15T08:00:44Z
dc.date.available2017-11-15T08:00:44Z
dc.date.issued2016
dc.identifier.issn2072-4292 (Electronic)
dc.identifier.urihttps://hdl.handle.net/2454/26146
dc.description.abstractThe spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil profiles have continuous spectral components, it is clear that roughness parameters are influenced by the sampling interval of the measurement device employed. In this work, we contributed to answer which sampling interval the profiles needed to be measured at to accurately account for the microwave response of agricultural surfaces. For this purpose, a 2-D laser profiler was built and used to measure surface soil roughness at field scale over agricultural sites in Argentina. Sampling intervals ranged from large (50 mm) to small ones (1 mm), with several intermediate values. Large- and intermediate-sampling-interval profiles were synthetically derived from nominal, 1 mm ones. With these data, the effect of sampling-interval-dependent roughness parameters on backscatter response was assessed using the theoretical backscatter model IEM2M. Simulations demonstrated that variations of roughness parameters depended on the working wavelength and was less important at L-band than at C- or X-band. In any case, an underestimation of the backscattering coefficient of about 1-4 dB was observed at larger sampling intervals. As a general rule a sampling interval of 15 mm can be recommended for L-band and 5 mm for C-band.en
dc.description.sponsorshipThis work was funded by the Agencia Nacional de Promoción Científica y Tecnológica (ANPCyT) (PICT 2060), MinCyT-CONAE-CONICET project 12 and SARAT-SAOCOM project 17.en
dc.format.extent19 p.
dc.format.mimetypeapplication/pdfen
dc.language.isoengen
dc.publisherMDPIen
dc.relation.ispartofRemote Sensing, 2016, 8(6), 458en
dc.rights© 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license.en
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.subjectSurface soil roughnessen
dc.subjectLaser profileren
dc.subjectHeight standard deviationen
dc.subjectCorrelation lengthen
dc.subjectRadar applicationsen
dc.subjectScattering modelsen
dc.titleEffects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfacesen
dc.typeArtículo / Artikuluaes
dc.typeinfo:eu-repo/semantics/articleen
dc.contributor.departmentUniversidad Pública de Navarra. Departamento de Proyectos e Ingeniería Rurales_ES
dc.contributor.departmentNafarroako Unibertsitate Publikoa. Landa Ingeniaritza eta Proiektuak Sailaeu
dc.rights.accessRightsAcceso abierto / Sarbide irekiaes
dc.rights.accessRightsinfo:eu-repo/semantics/openAccessen
dc.identifier.doi10.3390/rs8060458
dc.relation.publisherversionhttps://dx.doi.org/10.3390/rs8060458
dc.type.versionVersión publicada / Argitaratu den bertsioaes
dc.type.versioninfo:eu-repo/semantics/publishedVersionen


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© 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license.
Except where otherwise noted, this item's license is described as © 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license.