Listar Artículos de revista DIEE - IEES Aldizkari artikuluak por autor "Decoutere, Stefaan"
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Characterization of RF-MOSFETs in common-source configuration at different source-to-bulk voltages from S-parameters
Zárate-Rincón, Fabián; Álvarez Botero, Germán Andrés; Torres-Torres, Reydezel; Murphy-Arteaga, Roberto S.; Decoutere, Stefaan (IEEE, 2013) Artículo / ArtikuluaUsing a new test fixture that allows us to bias the bulk terminal through an additional compensated DC probe, a two-port S-measurement-based methodology to characterize RF-MOSFETs in common-source configuration is herein ...