Listar Artículos de revista DIEE - IEES Aldizkari artikuluak por tema "S-parameters"
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Modeling and parameter extraction of test fixtures for MOSFET on-wafer measurements up to 60 GHz
We present a circuit model and parameter determination methodology for test fixtures used for on-wafer S-parameter measurements on CMOS devices. The model incorporates the frequency dependence of the series resistances and ...