Open Access
Mode transition during deposition of nanoscale ITO coatings on tilted fiber Bragg gratings
(Optica Publishing Group, 2022) Imas González, José Javier; Albert, Jacques; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Ruiz Zamarreño, Carlos; Matías Maestro, Ignacio; Ingeniería Eléctrica, Electrónica y de Comunicación; Institute of Smart Cities - ISC; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren
The mode transition phenomenon is experimentally demonstrated in tilted fiber Bragg gratings (TFBG) through the deposition of an indium tin oxide (ITO) thin film employing a DC sputtering machine.
Open Access
Performance analysis of a distributed optical fiber vibration sensor based on a sagnac interferometer
(BMO/SBMag, 2023) Ozcariz Celaya, Aritz; Heim Weber, Guilherme; Gomes, Danilo Fernandes; Costa, Igor Brutkowski Vieira da; Galvão, José Rodolfo; Martins, Victor Matheus; Pipa, Daniel R.; Silva, Marco J. da; Cardozo da Silva, Jean Carlos; Ruiz Zamarreño, Carlos; Martelli, Cicero; Ingeniería Eléctrica, Electrónica y de Comunicación; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren
In this work, measuring capabilities of a Sagnac Interferometer-based Distributed Optical Fiber Sensor (DOFS) system are demonstrated by comparing its results to a conventional amplitude-based Distributed Acoustic Sensing (DAS) system. Through a set of three different experiments, it was demonstrated that both sensing systems can detect and locate dynamical deformation along the fiber, in addition to determining its frequency components. The coherent amplitude-based DAS presented a lower background noise. In contrast, even though the Sagnac interferometry-based system presented low-frequency noise in the measurements, it is less susceptible to harmonic distortion for higher amplitude deformations since its sensing principles rely on the measurement of the accumulated phase rather than the amplitude of the backscattered signal purely. Accordingly, the Sagnac interferometry-based system arises as a promising and rather accessible topology for a DOFS implementation.
Open Access
Surface exciton polariton resonances (SEPR)-based sensors
(Elsevier, 2023) Vitoria Pascual, Ignacio; Ruiz Zamarreño, Carlos; Ozcariz Celaya, Aritz; Imas González, José Javier; Del Villar, Ignacio; Matías Maestro, Ignacio; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de Comunicación
A new type of resonance in the development of sensors using long-range surface exciton polariton (LRSEP) phenomena has been coined: surface exciton plasmon resonance (SEPR). The resonance was obtained in the reflected spectrum of a Kretschmann-Raether setup with a two-coupled-interface structure composed of 412 nm magnesium fluoride and 50 nm chromium thin films. The roles of different parameters such as thicknesses of the films and the incidence angles have been simulated. Some preliminary experimental results show a promising performance with a shift of the resonance central wavelength with changes in the incidence angle of -136.52 nm/° and a sensitivity of 23,221 nm/refractive index unit.
Open Access
Mode transitions and thickness measurements during deposition of nanoscale TiO2 coatings on tilted fiber Bragg gratings
(IEEE, 2022) Imas González, José Javier; Albert, Jacques; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Ruiz Zamarreño, Carlos; Matías Maestro, Ignacio; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren; Institute of Smart Cities - ISC; Ingeniería Eléctrica, Electrónica y de Comunicación
The mode transition is a phenomenon observed in thin film coated long period fiber gratings (LPGs) and singlemode multimode single-mode (SMS) fibers for certain values of the coating thickness and refractive index, resulting in increased sensitivity for sensing applications. It is shown here that mode transitions occur simultaneously for a large number of mode resonances in the transmission spectra of tilted fiber Bragg gratings (TFBG) measured during the deposition of ~350nm thick TiO2 coatings by Atomic Layer Deposition (ALD). In TFBGs, the mode transition shows up as an acceleration of the resonance wavelength shift vs thickness, but without fading of the resonance amplitude. Furthermore, the results show that the mode transition for cladding modes with predominantly “TE” polarization at the cladding boundary is significantly sharper than that of predominantly “TM” polarized modes and that it occurs at a smaller coating thickness (<100 nm vs >200 nm). Finally, using a separately determined coating refractive index (2.14, by ellipsometry on witness flats deposited simultaneously) and simulations of the resonance shifts of the TFBG with coating thickness, it is demonstrated that a TFBG connected to a spectral interrogation system can be used to measure the growth of a coating on the surface of the fiber in real time.
Open Access
A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
(Elsevier, 2025-02-01) Imas González, José Javier; Matías Maestro, Ignacio; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Vitoria Pascual, Ignacio; Ruiz Zamarreño, Carlos; Ingeniería Eléctrica, Electrónica y de Comunicación; Ingeniaritza Elektrikoa, Elektronikoa eta Telekomunikazio Ingeniaritza; Institute of Smart Cities - ISC
From an optical perspective, depending on the relationship between the real (n) and imaginary (k) parts of its refractive index, three broad categories of materials can be distinguished: metals (k ¿ n), dielectrics (n ¿ k), and materials in which n ¿ k (termed here excitonic materials). The modes and optical resonances that appear in a thin film bounded by two dielectrics with similar refractive index, what we call here a double interface structure, have been widely studied in the case of metals, but not for dielectrics, or materials with n ¿ k. In this work, we propose a new approach, based on employing the phase matching condition to correlate the resonances that appear in the wavelength versus incident angle color maps of the reflected power with the modal analysis of the cross section of the structure. This analysis is performed, using an attenuated total reflection (ATR) setup, for thin film materials that belong to each of the mentioned categories: a metal (gold, Au), a dielectric (titanium dioxide, TiO2), and a material with n ¿ k (chromium, Cr). The theoretical analysis is supported with experimental results. It is demonstrated that this method enables to identify any resonance at any wavelength or incident angle, being valid for all three types of materials. Therefore, it is considered the suggested approach will help the research in these materials and in the double interface structure in the optics and photonics field.
Open Access
All-fiber ellipsometer for nanoscale dielectric coatings
(Chinese Academy of Sciences, 2023) Imas González, José Javier; Matías Maestro, Ignacio; Del Villar, Ignacio; Ozcariz Celaya, Aritz; Ruiz Zamarreño, Carlos; Albert, Jacques; Ingeniería Eléctrica, Electrónica y de Comunicación; Institute of Smart Cities - ISC; Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren
Multiple mode resonance shifts in tilted fiber Bragg gratings (TFBGs) are used to simultaneously measure the thickness and the refractive index of TiO2 thin films formed by Atomic Layer Deposition (ALD) on optical fibers. This is achieved by comparing the experimental wavelength shifts of 8 TFBG resonances during the deposition process with simulated shifts from a range of thicknesses (T) and values of the real part of the refractive index (n). The minimization of an error function computed for each (n, T) pair then provides a solution for the thickness and refractive index of the deposited film and, a posteriori, to verify the deposition rate throughout the process from the time evolution of the wavelength shift data. Validations of the results were carried out with a conventional ellipsometer on flat witness samples deposited simultaneously with the fiber and with scanning electron measurements on cut pieces of the fiber itself. The final values obtained by the TFBG (n = 2.25, final thickness of 185 nm) were both within 4% of the validation measurements. This approach provides a method to measure the formation of nanoscale dielectric coatings on fibers in situ for applications that require precise thicknesses and refractive indices, such as the optical fiber sensor field. Furthermore, the TFBG can also be used as a process monitor for deposition on other substrates for deposition methods that produce uniform coatings on dissimilar shaped substrates, such as ALD.