A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures

dc.contributor.authorImas González, José Javier
dc.contributor.authorMatías Maestro, Ignacio
dc.contributor.authorDel Villar, Ignacio
dc.contributor.authorOzcariz Celaya, Aritz
dc.contributor.authorVitoria Pascual, Ignacio
dc.contributor.authorRuiz Zamarreño, Carlos
dc.contributor.departmentIngeniería Eléctrica, Electrónica y de Comunicaciónes_ES
dc.contributor.departmentIngeniaritza Elektrikoa, Elektronikoa eta Telekomunikazio Ingeniaritzaeu
dc.contributor.departmentInstitute of Smart Cities - ISCen
dc.date.accessioned2024-11-19T12:23:02Z
dc.date.available2024-11-19T12:23:02Z
dc.date.issued2025-02-01
dc.date.updated2024-11-19T12:13:13Z
dc.description.abstractFrom an optical perspective, depending on the relationship between the real (n) and imaginary (k) parts of its refractive index, three broad categories of materials can be distinguished: metals (k ¿ n), dielectrics (n ¿ k), and materials in which n ¿ k (termed here excitonic materials). The modes and optical resonances that appear in a thin film bounded by two dielectrics with similar refractive index, what we call here a double interface structure, have been widely studied in the case of metals, but not for dielectrics, or materials with n ¿ k. In this work, we propose a new approach, based on employing the phase matching condition to correlate the resonances that appear in the wavelength versus incident angle color maps of the reflected power with the modal analysis of the cross section of the structure. This analysis is performed, using an attenuated total reflection (ATR) setup, for thin film materials that belong to each of the mentioned categories: a metal (gold, Au), a dielectric (titanium dioxide, TiO2), and a material with n ¿ k (chromium, Cr). The theoretical analysis is supported with experimental results. It is demonstrated that this method enables to identify any resonance at any wavelength or incident angle, being valid for all three types of materials. Therefore, it is considered the suggested approach will help the research in these materials and in the double interface structure in the optics and photonics field.en
dc.description.sponsorshipThis work was supported by Agencia Estatal de Investigación (PID2022-137437OB-I00).
dc.format.mimetypeapplication/pdfen
dc.format.mimetypeapplication/msworden
dc.identifier.citationImas, J. J., Matías, I. R., Del Villar, I., Ozcáriz, A., Vitoria, I., Zamarreño, C. R. (2025). A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures. Optics and Laser Technology, 181, 1-9. https://doi.org/10.1016/j.optlastec.2024.111771.
dc.identifier.doi10.1016/j.optlastec.2024.111771
dc.identifier.issn0030-3992
dc.identifier.urihttps://academica-e.unavarra.es/handle/2454/52537
dc.language.isoeng
dc.publisherElsevier
dc.relation.ispartofOptics and Laser Technology (2025), vol. 181, part. B, 111771
dc.relation.projectIDinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-137437OB-I00/ES/
dc.relation.publisherversionhttps://doi.org/10.1016/j.optlastec.2024.111771
dc.rights© 2024 The Author(s). This is an open access article under the CC BY-NC-ND license.
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectDouble interface structureen
dc.subjectLong range surface exciton polariton (LRSEP)en
dc.subjectLong range surface plasmon polariton (LRSPP)en
dc.subjectLossy mode resonance (LMR)en
dc.subjectOptical resonancesen
dc.subjectSurface plasmon resonance (SPR)en
dc.subjectThin filmen
dc.titleA comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structuresen
dc.typeinfo:eu-repo/semantics/article
dc.type.versioninfo:eu-repo/semantics/publishedVersion
dspace.entity.typePublication
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