Refractometric sensors based on multimode interference in a thin-film coated singlemode– multimode–single-mode structure with reflection configuration
| dc.contributor.author | Del Villar, Ignacio | |
| dc.contributor.author | Socorro Leránoz, Abián Bentor | |
| dc.contributor.author | Corres Sanz, Jesús María | |
| dc.contributor.author | Arregui San Martín, Francisco Javier | |
| dc.contributor.author | Matías Maestro, Ignacio | |
| dc.contributor.department | Ingeniería Eléctrica y Electrónica | es_ES |
| dc.contributor.department | Ingeniaritza Elektrikoa eta Elektronikoa | eu |
| dc.contributor.funder | Gobierno de Navarra / Nafarroako Gobernua | es |
| dc.date.accessioned | 2018-03-28T08:21:36Z | |
| dc.date.available | 2018-03-28T08:21:36Z | |
| dc.date.issued | 2014 | |
| dc.description.abstract | Thin-film coated single-mode–multimode–single-mode (SMS) structures have been analyzed both theoretically and experimentally with the aim of detecting different refractive indices. By adequate selection of the thickness of the thin film and of the diameter of the multimode segment in the SMS structure, a seven-fold improvement can be obtained in the sensitivity of the device to the surrounding medium refractive index, achieving a maximum sensitivity of 1199.18 nm∕refractive index unit for the range of refractive indices from 1.321 to 1.382. Using layer-by-layer self-assembly for deposition, both on the cladding and on the tip of the multimode segment, allows the reflected power to increase, which avoids the application of a mirror on the tip of the multimode segment. | en |
| dc.description.sponsorship | This work was supported in part by the Spanish Ministry of Education and Science-FEDER TEC2010-17805 and Government of Navarra research grants. | en |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.doi | 10.1364/AO.53.003913 | |
| dc.identifier.issn | 1559-128X (Print) | |
| dc.identifier.issn | 2155-3165 (Electronic) | |
| dc.identifier.uri | https://academica-e.unavarra.es/handle/2454/28109 | |
| dc.language.iso | eng | en |
| dc.publisher | Optical Society of America | en |
| dc.relation.ispartof | Applied Optics Vol. 53, Issue 18, pp. 3913-3919 (2014) | en |
| dc.relation.publisherversion | https://doi.org/10.1364/AO.53.003913 | |
| dc.rights | © 2014 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited. | en |
| dc.rights.accessRights | info:eu-repo/semantics/openAccess | |
| dc.subject | Fiber optics sensors | en |
| dc.subject | Thin films | en |
| dc.subject | Interferometry | en |
| dc.title | Refractometric sensors based on multimode interference in a thin-film coated singlemode– multimode–single-mode structure with reflection configuration | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.type.version | info:eu-repo/semantics/acceptedVersion | |
| dspace.entity.type | Publication | |
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