Modeling and parameter extraction of test fixtures for MOSFET on-wafer measurements up to 60 GHz
| dc.contributor.author | Álvarez Botero, Germán Andrés | |
| dc.contributor.author | Torres-Torres, Reydezel | |
| dc.contributor.author | Murphy-Arteaga, Roberto S. | |
| dc.contributor.department | Ingeniería Eléctrica y Electrónica | es_ES |
| dc.contributor.department | Ingeniaritza Elektrikoa eta Elektronikoa | eu |
| dc.date.accessioned | 2024-02-12T13:41:37Z | |
| dc.date.available | 2024-02-12T13:41:37Z | |
| dc.date.issued | 2013 | |
| dc.date.updated | 2024-02-12T13:41:06Z | |
| dc.description.abstract | We present a circuit model and parameter determination methodology for test fixtures used for on-wafer S-parameter measurements on CMOS devices. The model incorporates the frequency dependence of the series resistances and inductances due to the skin effect occurring in the metal pads. Physically based representations for this effect allow for excellent theory-experiment correlations for different dummy structures, as well as when de-embedding transistor measurements up to 60 GHz. | en |
| dc.description.sponsorship | They acknowledge the partial support of this project by CONACyT through Grant 83774-Y, and the scholarship to undertake doctoral studies number 213292. | en |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.citation | Álvarez-Botero, G., Torres-Torres, R., Murphy-Arteaga, R. S. (2013) Modeling and parameter extraction of test fixtures for MOSFET on-wafer measurements up to 60 GHz. International Journal of RF and Microwave Computer-Aided Engineering, 23(6), 655-661. https://doi.org/10.1002/mmce.20701. | en |
| dc.identifier.doi | 10.1002/mmce.20701 | |
| dc.identifier.issn | 1096-4290 | |
| dc.identifier.uri | https://academica-e.unavarra.es/handle/2454/47472 | |
| dc.language.iso | eng | en |
| dc.publisher | Wiley | en |
| dc.relation.ispartof | International Journal of RF and Microwave Computer-Aided Engineering 23: 655-661 | en |
| dc.relation.publisherversion | https://doi.org/10.1002/mmce.20701 | |
| dc.rights | © 2012 Wiley Periodicals, Inc. | en |
| dc.rights.accessRights | info:eu-repo/semantics/openAccess | |
| dc.subject | RF-measurements | en |
| dc.subject | S-parameters | en |
| dc.subject | Test fixtures | en |
| dc.subject | Equivalent circuit modeling | en |
| dc.subject | CMOSdevices | en |
| dc.title | Modeling and parameter extraction of test fixtures for MOSFET on-wafer measurements up to 60 GHz | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.type.version | info:eu-repo/semantics/acceptedVersion | |
| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | 58d4f996-e27b-45a9-b93a-c397d7fa5e0a | |
| relation.isAuthorOfPublication.latestForDiscovery | 58d4f996-e27b-45a9-b93a-c397d7fa5e0a |