Filtrar por: Materia
Mostrando ítems 1-5 de 1
| Atomic force microscopy (AFM) (1) |
| Epsilon-near-zero (ENZ) (1) |
| Fourier transform infrared (FTIR) (1) |
| Kretschmann-Raether (1) |
| SPhP (1) |
Mostrando ítems 1-5 de 1
| Atomic force microscopy (AFM) (1) |
| Epsilon-near-zero (ENZ) (1) |
| Fourier transform infrared (FTIR) (1) |
| Kretschmann-Raether (1) |
| SPhP (1) |
