Addressing the impact of surface roughness on epsilon-near-zero silicon carbide substrates
Fecha
2023Autor
Versión
Acceso abierto / Sarbide irekia
Tipo
Artículo / Artikulua
Versión
Versión aceptada / Onetsi den bertsioa
Identificador del proyecto
Impacto
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10.1021/acsphotonics.3c00476
Resumen
Epsilon-near-zero (ENZ) media have been very actively investigated due to their unconventional wave phenomena and strengthened nonlinear response. However, the technological impact of ENZ media will be determined by the quality of realistic ENZ materials, including material loss and surface roughness. Here, we provide a comprehensive experimental study of the impact of surface roughness on ENZ su ...
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Epsilon-near-zero (ENZ) media have been very actively investigated due to their unconventional wave phenomena and strengthened nonlinear response. However, the technological impact of ENZ media will be determined by the quality of realistic ENZ materials, including material loss and surface roughness. Here, we provide a comprehensive experimental study of the impact of surface roughness on ENZ substrates. Using silicon carbide (SiC) substrates with artificially induced roughness, we analyze samples whose roughness ranges from a few to hundreds of nanometer size scales. It is concluded that ENZ substrates with roughness in the few nanometer scale are negatively affected by coupling to longitudinal phonons and strong ENZ fields normal to the surface. On the other hand, when the roughness is in the hundreds of nanometers scale, the ENZ band is found to be more robust than dielectric and surface phonon polariton (SPhP) bands. [--]
Materias
Atomic force microscopy (AFM),
Epsilon-near-zero (ENZ),
Fourier transform infrared (FTIR),
Kretschmann-Raether,
SPhP
Editor
American Chemical Society
Publicado en
ACS Photonics, 2023,10, 3105-3114
Departamento
Universidad Pública de Navarra. Departamento de Ingeniería Eléctrica, Electrónica y de Comunicación /
Nafarroako Unibertsitate Publikoa. Ingeniaritza Elektrikoa, Elektronikoa eta Telekomunikazio Ingeniaritza Saila /
Universidad Pública de Navarra/Nafarroako Unibertsitate Publikoa. Institute of Smart Cities - ISC
Versión del editor
Entidades Financiadoras
I.L. acknowledgessupportfrom Ramón y Cajal fellowshipRYC2018-024123-Iand projectRTI2018-093714-301J-I00sponsoredby MCIU/AEI/FEDER/UE,and ERC StartingGrant 948504.