Publication:
Monitoring the etching process in LPFGs towards development of highly sensitive sensors

dc.contributor.authorDel Villar, Ignacio
dc.contributor.authorCruz, José Luises_ES
dc.contributor.authorSocorro Leránoz, Abián Bentor
dc.contributor.authorDíaz Lucas, Silvia
dc.contributor.authorCorres Sanz, Jesús María
dc.contributor.authorArregui San Martín, Francisco Javier
dc.contributor.authorMatías Maestro, Ignacio
dc.contributor.departmentIngeniaritza Elektrikoa eta Elektronikoaeu
dc.contributor.departmentInstitute for Advanced Materials and Mathematics - INAMAT2en
dc.contributor.departmentIngeniería Eléctrica y Electrónicaes_ES
dc.contributor.funderGobierno de Navarra / Nafarroako Gobernua: 2016/PI008
dc.contributor.funderGobierno de Navarra / Nafarroako Gobernua: 2016/PC025
dc.contributor.funderGobierno de Navarra / Nafarroako Gobernua: 2016/PC026
dc.date.accessioned2017-11-15T08:00:40Z
dc.date.available2017-11-15T08:00:40Z
dc.date.issued2017
dc.descriptionTrabajo presentado en la Eurosensors 2017 Conference. París, 3–6 de septiembre de 2017.es_ES
dc.description.abstractIn this work, the monitoring of the etching process up to a diameter of 30 µm of two LPFG structures has been compared, one of them had initially 125 µm, whereas the second one had 80 µm. By tracking the wavelength shift of the resonance bands during the etching process it is possible to check the quality of etching process (the 80 µm fibre performs better than de 125 µm fibre), and to stop for a specific cladding mode coupling, which permits to obtain an improved sensitivity compared to the initial structure.en
dc.description.sponsorshipThis work was supported by the Spanish Agencia Estatal de Investigación (AEI) and Fondo Europeo de Desarrollo Regional (FEDER) TEC2016-78047-R and by the Government of Navarre through its projects with references: 2016/PI008, 2016/PC025 and 2016/PC026.en
dc.format.extent4 p.
dc.format.mimetypeapplication/pdfen
dc.identifier.doi10.3390/proceedings1040331
dc.identifier.issn2504-3900
dc.identifier.urihttps://academica-e.unavarra.es/handle/2454/26129
dc.language.isoengen
dc.publisherMDPIen
dc.relation.ispartofProceedings, 1(4), 331en
dc.relation.projectIDinfo:eu-repo/grantAgreement/ES/1PE/TEC2016-78047-Ren
dc.relation.publisherversionhttps://dx.doi.org/10.3390/proceedings1040331
dc.rights© 2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.en
dc.rights.accessRightsAcceso abierto / Sarbide irekiaes
dc.rights.accessRightsinfo:eu-repo/semantics/openAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.subjectEtchingen
dc.subjectLong period fiber gratingen
dc.subjectOptic fibre sensoren
dc.subjectRefractive indexen
dc.titleMonitoring the etching process in LPFGs towards development of highly sensitive sensorsen
dc.typeContribución a congreso / Biltzarrerako ekarpenaes
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.type.versionVersión publicada / Argitaratu den bertsioaes
dc.type.versioninfo:eu-repo/semantics/publishedVersionen
dspace.entity.typePublication
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