On the influence of spatial resolution in soil surface roughness characterization using Tls and Sfm techniques

dc.contributor.authorMartínez de Aguirre Escobar, Alejandro
dc.contributor.authorÁlvarez-Mozos, Jesús
dc.contributor.authorGiménez Díaz, Rafael
dc.contributor.authorMilenković, Milutin
dc.contributor.authorPfeifer, Norbert
dc.contributor.departmentIngenieríaes_ES
dc.contributor.departmentIngeniaritzaeu
dc.date.accessioned2021-04-20T11:23:36Z
dc.date.available2021-04-20T11:23:36Z
dc.date.issued2018
dc.description.abstractSoil surface roughness strongly affects the scattering of microwaves and determines the backscattering coefficient observed by SAR (Synthetic Aperture Radar) sensors. The aim of this study is to analyze the influence of the spatial resolution of Terrestrial Laser Scanner (TLS) and Structure from Motion (SfM) techniques to parameterize surface roughness over agricultural soils. Three experimental plots (5 x 5 meters) representing different roughness conditions were measured by TLS and SfM techniques. Roughness parameters (s and l) were calculated from profiles obtained at different spatial resolutions in parallel and in perpendicular to the tillage direction on each plot. The results showed minor differences in the parameters values between both techniques and, in general, a decreasing trend and an increasing trend for lower spatial resolutions for parameter s and l, respectively.en
dc.description.sponsorshipThis work was partly funded by project CGL2016-75217-R (MINECO/FEDER, EU).en
dc.format.extent4 p.
dc.format.mimetypeapplication/pdfen
dc.identifier.citationA. Martinez-Agirre et al., 'On the Influence of Spatial Resolution in Soil Surface Roughness Characterization Using Tls and Sfm Techniques,' IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium, Valencia, Spain, 2018, pp. 3362-3365, doi: 10.1109/IGARSS.2018.8518553.en
dc.identifier.doi10.1109/IGARSS.2018.8518553
dc.identifier.isbn978-1-5386-7151-1
dc.identifier.issn2153-7003 (Electronic)
dc.identifier.urihttps://academica-e.unavarra.es/handle/2454/39563
dc.language.isoengen
dc.publisherIEEEen
dc.relation.ispartof2018 IEEE International Geoscience & Remote Sensing Symposium (IGARSS): proceedings. July 22–27, 2018, Valencia, Spainen
dc.relation.projectIDinfo:eu-repo/grantAgreement/ES/1PE/CGL2016-75217-R/
dc.relation.publisherversionhttps://doi.org/10.1109/IGARSS.2018.8518553
dc.rights© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other work.en
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.subjectSurface roughnessen
dc.subjectMeasurement techniquesen
dc.subjectTLSen
dc.subjectSfMen
dc.subjectSpatial resolutionen
dc.titleOn the influence of spatial resolution in soil surface roughness characterization using Tls and Sfm techniquesen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.type.versioninfo:eu-repo/semantics/acceptedVersion
dspace.entity.typePublication
relation.isAuthorOfPublication5d3b3768-602b-4b6c-85e0-9e6209660b0c
relation.isAuthorOfPublicationf2f80825-fc58-4e45-9814-9eb10b68c4a9
relation.isAuthorOfPublication230a3794-d067-42ca-b177-82dcf27762c9
relation.isAuthorOfPublication.latestForDiscovery5d3b3768-602b-4b6c-85e0-9e6209660b0c

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