Analysis of the influence of the relative position between the THz header and the measured sample on the THz signal

das-Nano measures features of materials by analyzing the THz signal that is reflected through the measuring sample. In certain applications, these measurements are conducted in industrial environments, such as measuring the thickness of car body coatings on production lines. To ensure accurate results, it is necessary for the measurement conditions to be optimal, which includes ensuring a stable relative positioning between the measurement head and the elements being measured. The degree of stabilization of this relative positioning between the head and the measured elements is determined by the movements of the supporting elements. This project aims to characterize the movements suffered by the head and the elements to be measured (e.g. car body) in an industrial application environment. Measurements will be conducted at various locations within the installation, and the collected data will be processed to extract the desired information. Furthermore, an analysis will be performed on how the changes in the relative position between the header and the sample to be measured truly affects the measuring. Different distance and orientation measurements will be conducted, and their impact on the received THz signal will be analyzed. This study not only contributes to understanding the effect of positional alterations in terahertz signal reception but also provides crucial insights for optimizing future installations and measurements in practical applications.