Publication:
Analysis of polyamide and fluoropolymer backsheets: Degradation and insulation failure in field-aged photovoltaic modules

Consultable a partir de

Date

2022

Director

Publisher

John Wiley & Sons
Acceso abierto / Sarbide irekia
Artículo / Artikulua
Versión publicada / Argitaratu den bertsioa

Project identifier

AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-110816RB-C21/ES

Abstract

Durability of photovoltaic (PV) modules is of great concern not only from the point of view of cost-effectiveness but also from the point of view of safety and sustainability. The backsheet of a PV module is one of the most critical parts of the PV module from the point of view of protection and also one of the most important sources of PV modules' failure; hence, it is of great importance to understand its different forms of failure. In this paper we analyze the case of an 8-MW PV plant, which had suffered a rapid degradation of their PV modules' backsheets. The case is especially relevant as all the PV modules are from the same model and manufacturer but with different backsheet materials (polyamide and fluoropolymer) and different times of exposure: on one hand, all PV modules originally installed in the plant (i.e., 6 years under operation when tested), and also, extra modules that had been stored indoors for replacement and had been mounted in the plant for less than 1 year when tested, serving as reference modules. In this paper we present the signs of degradation of these PV modules after different times of exposure under real operation using different on-field and laboratory tests. We propose different techniques for rapid diagnosis of backsheet degradation so that the problem can be detected at a very early stage, before it results in major energy losses or in safety issues.

Keywords

Backsheet, Chalking, Degradation, Insulation resistance, PV

Department

Ingeniería Eléctrica, Electrónica y de Comunicación / Institute of Smart Cities - ISC / Ingeniaritza Elektrikoa, Elektronikoaren eta Telekomunikazio Ingeniaritzaren

Faculty/School

Degree

Doctorate program

Editor version

Funding entities

This work has been supported by the Spanish State Research Agency(AEI) and ERDF-UE under grant PID2019-110816RB-C21. We would like to thank the Universidad Pública de Navarra for funding the Open Access fee.

© 2022 The Authors. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.

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