Exploring surface roughness in epsilon-near-zero materials

Navajas Hernández, David; Pérez Escudero, José Manuel; Liberal Olleta, Íñigo

Publication:
Exploring surface roughness in epsilon-near-zero materials

dc.contributor.author	Navajas Hernández, David
dc.contributor.author	Pérez Escudero, José Manuel
dc.contributor.author	Liberal Olleta, Íñigo
dc.contributor.department	Ingeniería Eléctrica, Electrónica y de Comunicación	es_ES
dc.contributor.department	Ingeniaritza Elektrikoa, Elektronikoa eta Telekomunikazio Ingeniaritza	eu
dc.contributor.department	Institute of Smart Cities - ISC	en
dc.date.accessioned	2025-03-03T11:43:41Z
dc.date.available	2025-03-03T11:43:41Z
dc.date.issued	2024-10-08
dc.date.updated	2025-03-03T11:39:05Z
dc.description.abstract	The practical application of materials with epsilon-near-zero (ENZ) characteristics heavily depends on the quality of real-world ENZ materials, considering factors like material losses and surface roughness. These materials have drawn interest due to their strong nonlinear responses and unique behavior. In this study, an experimental examination of how surface roughness affects ENZ substrates is presented. We employed silicon carbide (SiC) substrates deliberately engineered to exhibit different levels of roughness, enabling us to analyze samples spanning from a few to hundreds of nanometers in size scales. Substrates with nanoscale roughness experience adverse effects due to longitudinal phonon coupling and strong ENZ fields, while at larger roughness scales, the ENZ band demonstrates to be more robust compared to dielectric and surface phonon polariton (SPhP) bands.	en
dc.description.sponsorship	This work was supported by ERC Starting Grant 948504 NZINATECH. I.L. further acknowledges support from Ramon y Cajal fellowship RYC2018-024123-I.
dc.format.mimetype	application/pdf
dc.identifier.citation	Navajas, D., Pérez-Escudero, J. M., Liberal, I. (2024) Exploring surface roughness in epsilon-near-zero materials. In IEEE, 2024 18th International Congress on Artificial Materials for Novel Wave Phenomena (Metamaterials) (pp. 1-3). IEEE. https://doi.org/10.1109/Metamaterials62190.2024.10703296.
dc.identifier.doi	10.1109/Metamaterials62190.2024.10703296
dc.identifier.isbn	979-8-3503-7350-9
dc.identifier.uri	https://academica-e.unavarra.es/handle/2454/53640
dc.language.iso	eng
dc.publisher	IEEE
dc.relation.ispartof	IEEE. 2024 18th International Congress on Artificial Materials for Novel Wave Phenomena (Metamaterials). IEEE, 2024. p. 1-3
dc.relation.publisherversion	https://doi.org/10.1109/Metamaterials62190.2024.10703296
dc.rights	© 2024 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other work.
dc.rights.accessRights	info:eu-repo/semantics/openAccess
dc.subject	Couplings	en
dc.subject	Reflectivity	en
dc.subject	Silicon carbide	en
dc.subject	Phonons	en
dc.subject	Surface roughness	en
dc.subject	Optical materials	en
dc.subject	Rough surfaces	en
dc.subject	Optical reflection	en
dc.subject	Substrates	en
dc.subject	Optical surface waves	en
dc.title	Exploring surface roughness in epsilon-near-zero materials	en
dc.type	info:eu-repo/semantics/conferenceObject
dc.type.version	info:eu-repo/semantics/acceptedVersion
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