Publication:
Generation of surface plasmon resonance and lossy mode resonance by thermal treatment of ITO thin-films

Date

2014

Director

Publisher

Elsevier
Acceso abierto / Sarbide irekia
Artículo / Artikulua
Versión aceptada / Onetsi den bertsioa

Project identifier

MINECO//TEC2013-43679-R/ES/recolecta

Abstract

Silicon wafers coated with IndiumTinOxide (ITO) by application of sputtering technique have been characterized after different post-annealing techniques, showing that this last factor is critical for the quality of the thin-film and for the creation and tuning of both surface plasmon resonances and lossy mode resonances. By adequate selection of the ITO thin-film thickness both resonances can be tracked in the same spectrum, which can be used in sensor and optical communications fields.

Description

Keywords

Thin films, Optical resonance, Sensors

Department

Ingeniería Eléctrica y Electrónica / Ingeniaritza Elektrikoa eta Elektronikoa

Faculty/School

Degree

Doctorate program

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© 2014 Elsevier B.V. The manuscript version is made available under the CC BY-NC-ND 4.0 license.

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